МІХАЛЬ, О. . SCIENTIFIC AND TECHNICAL BASES OF ENHANCEMENT OF PRECISION CONDUCTOMETRIC MEASUREMENTS. Proceedings of the Institute of Electrodynamics of the National Academy of Sciences of Ukraine, Kyiv, Ukraine, n. 53, p. 090, 2019. DOI: 10.15407/publishing2019.53.090. Disponível em: https://prc.ied.org.ua/index.php/proceedings/article/view/146. Acesso em: 20 may. 2024.